Eric Johlin, AMOLF

Title: Super-Resolution Imaging of Light-Matter Interactions in Single Nanowires
Session: 15:30

Abstract

The strong optical absorption (often characterized as an extended absorption cross-section) and well-established fabrication of semi-conductor nanowires has led to wide interest and significant performance achievements for applications of both photovoltaics and photodetection. However, current techniques of measuring the light-matter interactions of these materials have relied on focused beams (suffering from diffraction limited resolution), complex near-field imaging methods (which always has some potential for interaction with the system being measured), or electron-based excitation (inherently only probing a single optical state component). In this work we investigate the use of a novel form of super-resolution photo-activated localization microscopy to measure interactions between single dipole emitters and silicon nanowires with resolution on the order of 10 nanometers. We perform 1- and 2-dimensional mappings of optical interactions, and demonstrate the use of analytical calculations to deconvolve the multiple phenomena observed in our experimental measurements.

Bio

to be announced

Powered by Invitado Visitor Management